样品照片：

Ram:

This product contains full area coverage WS2 few-layers that measure ~5 layers in thickness. Sheets are grown through chemical vapor deposition technique onto c-cut double side polished sapphire substrates, but layers c be trsferred onto other substrates by polymer assisted trsfer technique on demd (please select from the drop down menu). The sample measures 1cm2 in size d the entire sample surface contains few-layer thick WS2 sheet. Grown few-layers are high-crystalline as evidenced by HR-TEM, Ram, EDS, d XRD measurements. Please see the datasets in the product images.

Growth method: Our compy synthesizes these few layers using chemical vapor deposition (CVD) using highest purity (6N) gases d precursors in semiconductor grade facilities to produce crystalline d large domain size samples (1-50um). Other sources typically use MOCVD or sputtering process wherein defects are very large, domain sizes are small (10nm-500nm), d products are non-layered. Our samples are always highly crystallized, high purity, d perfectly layered.

Sample Properties